Title:
AGING DIAGNOSTIC DEVICE, AGING DIAGNOSTIC METHOD
Document Type and Number:
WIPO Patent Application WO/2011/027553
Kind Code:
A1
Abstract:
An aging diagnostic device has a reference-use ring oscillator (101) constituted by a ring oscillator using a odd-numbered plurality of logic gates constituted using CMOS circuits; a test-use ring oscillator (102) constituted by a ring oscillator using a odd-numbered plurality of logic gates of the same constitution as the logic gates; a load unit (104) for inputting a load signal for the test-use ring oscillator (102); a controller (105) for inputting control signals instructing starting of oscillation of the reference-use ring oscillator (101) and the test-use ring oscillator (102) to the reference-use ring oscillator (101) and the test-use ring oscillator (102) simultaneously; and a comparison unit (103) for comparing differences in displacement of pulses in both the reference-use ring oscillator (101) and the test-use ring oscillator (102) in the same amount of time.
Inventors:
SANEYOSHI EISUKE (JP)
NOSE KOICHI (JP)
MIZUNO MASAYUKI (JP)
NOSE KOICHI (JP)
MIZUNO MASAYUKI (JP)
Application Number:
PCT/JP2010/005387
Publication Date:
March 10, 2011
Filing Date:
September 01, 2010
Export Citation:
Assignee:
NEC CORP (JP)
SANEYOSHI EISUKE (JP)
NOSE KOICHI (JP)
MIZUNO MASAYUKI (JP)
SANEYOSHI EISUKE (JP)
NOSE KOICHI (JP)
MIZUNO MASAYUKI (JP)
International Classes:
H03K3/03; G01R31/28; H01L21/822; H01L27/04; H03K3/354; H03K5/26; H03K19/00; H03K19/0948
Foreign References:
| JPH0519027A | 1993-01-26 | |||
| JPH09127186A | 1997-05-16 | |||
| JPH08139279A | 1996-05-31 |
Attorney, Agent or Firm:
HAYAMI, SHINJI (JP)
Shinji Hayami (JP)
Shinji Hayami (JP)
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