ALPHA RAY OBSERVATION DEVICE, ALPHA RAY OBSERVATION SYSTEM, AND ALPHA RAY OBSERVATION METHOD

Title:

ALPHA RAY OBSERVATION DEVICE, ALPHA RAY OBSERVATION SYSTEM, AND ALPHA RAY OBSERVATION METHOD

Document Type and Number:

WIPO Patent Application WO/2014/125814

Kind Code:

A1

Abstract:

The alpha ray observation device (200), according to an embodiment, that observes alpha rays by way of detecting light caused by alpha rays in an object to be measured has: an alpha ray caused light wavelength selecting unit (1a) that can select light with wavelengths of light caused by alpha rays; an alpha ray caused light detecting unit (2a) that measures the amount of alpha ray caused light; a short-side wavelength selecting unit (1b) that can select short-side wavelength light that has a wavelength shorter than the alpha ray-caused light; a short-side wavelength light detecting unit (2b) that measures the amount of short-side wavelength light; a long-side wavelength selecting unit (1c) that can select long-side wavelength light that has a wavelength longer than the alpha ray-caused light; a long-side wavelength light detecting unit (2c) that measures the amount of long-side wavelength light; and a correcting unit (4) that calculates the amount of light after correction by correcting the amount of alpha ray-caused light.

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Inventors:

KUME NAOTO (JP)
KURODA HIDEHIKO (JP)
NAKAYAMA KUNIHIKO (JP)
TAKAKURA KEI (JP)

Application Number:

PCT/JP2014/000720

Publication Date:

August 21, 2014

Filing Date:

February 12, 2014

Export Citation:

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Assignee:

TOSHIBA KK (JP)

International Classes:

G01T1/205; G01T1/17; G01T1/20

Foreign References:

JP2000507698A	2000-06-20
US5493121A	1996-02-20
JP2000507698A	2000-06-20

Other References: