Title:
ANALYSIS ASSISTANCE METHOD, PROGRAM, AND ANALYSIS ASSISTANCE DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/024180
Kind Code:
A1
Abstract:
An analysis assistance method for providing assistance in analysis of stained images of a specimen, the method comprising: a step for preparing a plurality of stained images that are obtained by staining a single specimen using different types of staining, and that correspond to the respective types of staining (step S11); a step for dividing each of the stained images into a plurality of divisional regions in a predetermined division form (step S13); a step for obtaining a uniformity level indicating the uniformity of a stained state in each of the divisional regions in the respective stained images using a trained model generated through machine learning (step S14); and a step for determining whether or not each of the divisional region is suitable for a predetermined analysis method, on the basis of the uniformity level in each of the stained images (step S15). As a result, a region that is suitable for analysis and that is common to a plurality of stained images can be accurately presented.
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Inventors:
SHIBATA SAYA (JP)
Application Number:
PCT/JP2023/014737
Publication Date:
February 01, 2024
Filing Date:
April 11, 2023
Export Citation:
Assignee:
SCREEN HOLDINGS CO LTD (JP)
International Classes:
G01N33/48; C12M1/34; G06T1/00; G06T7/00
Domestic Patent References:
| WO2017150194A1 | 2017-09-08 |
Foreign References:
| JP2008185337A | 2008-08-14 | |||
| JP2018529074A | 2018-10-04 | |||
| JP2012073179A | 2012-04-12 | |||
| JP2011095225A | 2011-05-12 | |||
| JP2021061836A | 2021-04-22 | |||
| JP2020154952A | 2020-09-24 | |||
| JP2008535528A | 2008-09-04 | |||
| JP2020173204A | 2020-10-22 | |||
| JP2002165757A | 2002-06-11 | |||
| JP2022123488A | 2022-08-24 | |||
| US20190080450A1 | 2019-03-14 | |||
| CN112102247A | 2020-12-18 |
Attorney, Agent or Firm:
MATSUSAKA, Masahiro et al. (JP)
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