Title:
ANALYSIS DEVICE, ANALYSIS CHIP, AND TEMPERATURE MEASUREMENT METHOD FOR ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2012/132312
Kind Code:
A1
Abstract:
[Problem] To make it possible to accurately measure the temperature of a specimen solution using an infrared sensor in an analysis chip having a micro-channel, even when there is only a small amount of the specimen solution present in a designated analysis section of the micro-channel. [Solution] An analysis chip (10) provided with a micro-channel (11) for the passage of the specimen solution, and having an analysis section (14) that analyzes a substance to be detected that could be included in the specimen solution, and is located in a section of the micro-channel (11), the analysis chip being set and used in an analysis device for analyzing the substance to be detected using the analysis chip (10), and measuring the temperature of the specimen solution in the analysis section (14) using an infrared sensor (40). Therein, when being set in the analysis device, a metal film (18) is positioned at a location facing the infrared sensor (40) with the specimen sample in the analysis section (14) positioned therebetween.
Inventors:
HORII KAZUYOSHI (JP)
HAKAMATA MASASHI (JP)
HAKAMATA MASASHI (JP)
Application Number:
PCT/JP2012/001911
Publication Date:
October 04, 2012
Filing Date:
March 21, 2012
Export Citation:
Assignee:
FUJIFILM CORP (JP)
HORII KAZUYOSHI (JP)
HAKAMATA MASASHI (JP)
HORII KAZUYOSHI (JP)
HAKAMATA MASASHI (JP)
International Classes:
G01N35/00; G01N33/543; G01N37/00
Domestic Patent References:
| WO2005054826A1 | 2005-06-16 |
Foreign References:
| JP2000065732A | 2000-03-03 | |||
| JP2011043520A | 2011-03-03 |
Attorney, Agent or Firm:
YANAGIDA, Masashi et al. (JP)
Seiji Yanagida (JP)
Seiji Yanagida (JP)
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Claims: