Title:
ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2024/048143
Kind Code:
A1
Abstract:
Provided is a feature that enables accurate growth information to be obtained. This analysis device comprises: an acquisition means for acquiring a plurality of images captured from a plurality of directions, respectively, of an area including a plant and a plurality of markers installed in advance around the plant; a setting means for setting a reference region on the basis of the plurality of markers for each of the plurality of images; and an analysis means for acquiring information regarding the growth state of the plant by analyzing the reference region of each of the plurality of images.
Inventors:
ZENG XIANGYU (JP)
HOSOMI SHINICHI (JP)
HOSOMI SHINICHI (JP)
Application Number:
PCT/JP2023/027297
Publication Date:
March 07, 2024
Filing Date:
July 26, 2023
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
A01G7/00
Foreign References:
| JP2020099215A | 2020-07-02 | |||
| JP2019193582A | 2019-11-07 | |||
| US20200279374A1 | 2020-09-03 | |||
| JP2023035479A | 2023-03-13 | |||
| JP2022170060A | 2022-11-10 |
Attorney, Agent or Firm:
IP FIRM SHUWA (JP)
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