ANALYSIS DEVICE AND ANALYSIS METHOD

Title:

ANALYSIS DEVICE AND ANALYSIS METHOD

Document Type and Number:

WIPO Patent Application WO/2011/001917

Kind Code:

A1

Abstract:

Provided is an analysis device or an analysis method, by which highly reliable analysis results can be obtained even in the circumstances where environmental temperature changes, while reducing load on the user. The analysis device (1) is provided with a determining means (13) which determines whether environmental temperature measured by means of a temperature measuring means (6) is within a predetermined temperature range or not. The determining means (13) is so configured as to determine whether the environmental temperature is within the predetermined temperature range or not, even in the circumstances where information relating to a target substance in a sample cannot be obtained from the analysis device.

Inventors:

NAKANISHI HIROYUKI (JP)
UEHATA YOSHIHARU (JP)
KAWANISHI MASAKO (JP)
MURASE YOSUKE (JP)
TSUKADA MASASHI (JP)

Application Number:

PCT/JP2010/060896

Publication Date:

January 06, 2011

Filing Date:

June 25, 2010

Export Citation:

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Assignee:

ARKRAY INC (JP)
NAKANISHI HIROYUKI (JP)
UEHATA YOSHIHARU (JP)
KAWANISHI MASAKO (JP)
MURASE YOSUKE (JP)
TSUKADA MASASHI (JP)

International Classes:

G01N27/26; G01N27/28; G01N27/327; G01N27/416

Domestic Patent References:

WO2007100651A1	2007-09-07
WO2005108968A1	2005-11-17
WO2008004565A1	2008-01-10

Foreign References:

JP2002257782A	2002-09-11
JP2003156469A	2003-05-30
JPH08503304A	1996-04-09
JP2003042995A	2003-02-13
JPH04357452A	1992-12-10
JPH08320304A	1996-12-03
JP2004051249A	2004-02-19
JP2003527138A	2003-09-16
JP2008506468A	2008-03-06

Other References: