ANALYSIS DEVICE, ANALYSIS SYSTEM AND ANALYSIS METHOD

Title:

ANALYSIS DEVICE, ANALYSIS SYSTEM AND ANALYSIS METHOD

Document Type and Number:

WIPO Patent Application WO/2011/152376

Kind Code:

A1

Abstract:

Provided is technology which can improve the efficiency of analysis as a whole when a plurality of analyses are performed on a sample. An analysis device (A) is provided with: a first analysis unit (A1) for performing a first analysis on a sample; a second analysis unit (A2) for performing a second analysis on a sample; a short-time analysis unit (A3) for performing a short-time analysis on a sample, in which an analysis result can be derived in a shorter period of time than in the first analysis; and a determination unit (63) for determining whether or not to perform the second analysis, in accordance with the result of the short-time analysis and before the result of the first analysis is derived.

Inventors:

FUJIMOTO KOJI (JP)
FURUSATO NORIAKI (JP)

Application Number:

PCT/JP2011/062437

Publication Date:

December 08, 2011

Filing Date:

May 31, 2011

Export Citation:

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Assignee:

ARKRAY INC (JP)
FUJIMOTO KOJI (JP)
FURUSATO NORIAKI (JP)

International Classes:

G01N35/08; G01N35/00; G01N35/10

Foreign References:

JPH09329597A	1997-12-22
JP2007064680A	2007-03-15
JPH06241981A	1994-09-02
JPH10104229A	1998-04-24
JPH06102272A	1994-04-15
JPH06138120A	1994-05-20
JPH09127125A	1997-05-16
JP3616744B2	2005-02-02
JPH0792171A	1995-04-07
JPH0331242B2	1991-05-02
JPH0331374B2	1991-05-02

Other References: