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Patent Searching and Data


Title:
ANALYSIS DEVICE, ANALYSIS SYSTEM, AND ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2018/042606
Kind Code:
A1
Abstract:
An analysis device stores, in a storage device, a learning data set having a plurality of pieces of learning data including an actual value of an objective variable and actual values of a plurality of factors, a prediction data set having a plurality of pieces of prediction data derived from learning data including prediction values of the plurality of factors, and a learning model indicating a relationship between the actual value of the objective variable and the actual values of the plurality of factors; performs clustering of the prediction data set in such a manner that the values of the plurality of factors are similar to each other to generate a plurality of factor clusters; calculates, using the prediction data set, a co-occurrence amount of co-occurrence of the plurality of factors on the basis of a correlation of the plurality of factors; performs clustering of the plurality of factors on the basis of the co-occurrence amount to generate a plurality of co-occurrence clusters having one or more co-occurrence clusters including two or more factors; and feeds the learning model with, from among the prediction values of two or more factors in a specific prediction data group included in a specific factor cluster including two or more factors in the plurality of factor clusters, prediction values of two or more specific factors indicated by a specific co-occurrence cluster out of the plurality of co-occurrence clusters, thereby calculating a prediction value of the objective variable in the specific factor cluster.

Inventors:
SHIBAHARA TAKUMA (JP)
KANAMORI EIJI (JP)
OGINO MASAHIRO (JP)
SUZUKI MAYUMI (JP)
Application Number:
PCT/JP2016/075726
Publication Date:
March 08, 2018
Filing Date:
September 01, 2016
Export Citation:
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Assignee:
HITACHI LTD (JP)
International Classes:
G06Q50/22; G06Q10/04
Domestic Patent References:
WO2011089872A12011-07-28
Foreign References:
JP2008206575A2008-09-11
JP2006202235A2006-08-03
JP2011227838A2011-11-10
JP2001034688A2001-02-09
JP2012524945A2012-10-18
Attorney, Agent or Firm:
TOU-OU PATENT FIRM (JP)
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