Title:
ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/143355
Kind Code:
A1
Abstract:
This analysis device is provided with a plasma generator 3 which brings part of an analyte to a plasma state, and an optical analyzer 2 which analyzes the plasma light of the analyte emitted from the plasma generated by the plasma generator 3, wherein, by means of a conveyance device 4, the analyte contacts the plasma PB generated by the plasma generator 3 in order, and the analyte is conveyed such that a portion thereof is brought to a plasma state. The plasma generator 3 is provided with an electromagnetic wave irradiator which irradiates electromagnetic waves onto the generated plasma, and the conveyance device 4 forms a plasma contact area S where the bottom or side of the analyte contacts the plasma generated by the plasma generator 3.
Inventors:
IKEDA YUJI (JP)
Application Number:
PCT/JP2018/003437
Publication Date:
August 09, 2018
Filing Date:
February 01, 2018
Export Citation:
Assignee:
IMAGINEERING INC (JP)
International Classes:
G01N21/67; G01N21/68; H05H1/24
Domestic Patent References:
| WO2012036138A1 | 2012-03-22 | |||
| WO2015200111A1 | 2015-12-30 |
Foreign References:
| JP2009532198A | 2009-09-10 |
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