Title:
ANALYSIS METHOD AND ANALYZING DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/277024
Kind Code:
A1
Abstract:
This analysis method includes: a step for acquiring a plurality of items of actual measurement data having different measurement points, measured by a measuring device capable of measuring a quantity to be measured, with a certain resolution; and a step for generating, from the plurality of items of actual measurement data, super-resolution measurement data of which the resolution has been improved by super-resolution. A value of a hyperparameter used in the super-resolution is determined on the basis of a difference between super-resolution virtual measurement data generated by super-resolution employing a hyperparameter, from virtual measurement data generated on the basis of a predicted distribution of the quantity to be measured, and the distribution.
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Inventors:
HARADA SHUNTA (JP)
TSUJIMORI KOTA (JP)
HIROTANI JUN (JP)
TSUJIMORI KOTA (JP)
HIROTANI JUN (JP)
Application Number:
PCT/JP2022/025798
Publication Date:
January 05, 2023
Filing Date:
June 28, 2022
Export Citation:
Assignee:
NATIONAL UNIV CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH SYSTEM (JP)
International Classes:
G01N21/65; G01N21/27; G01N23/02; G01N23/2273; G06T3/40
Domestic Patent References:
| WO2007122838A1 | 2007-11-01 |
Foreign References:
| JP2016518747A | 2016-06-23 | |||
| US20140270456A1 | 2014-09-18 |
Attorney, Agent or Firm:
MORISHITA Sakaki (JP)
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