ANALYSIS SYSTEM, ANALYSIS DEVICE, MANAGEMENT DEVICE, AND COMPUTER PROGRAM

Title:

ANALYSIS SYSTEM, ANALYSIS DEVICE, MANAGEMENT DEVICE, AND COMPUTER PROGRAM

Document Type and Number:

WIPO Patent Application WO/2013/145676

Kind Code:

A1

Abstract:

In order to enable the registration of measurement parameters to be grasped on the management side in case the measurement parameters are erroneously registered, an analysis system (1) comprises an analysis device (100) which analyzes a sample in accordance with measurement parameters set for a reagent to be used, and a management device (200) which is connected to the analysis device to be communicable therewith via a network. The analysis device (100) is provided with a processing unit (120), and a transmission unit (126) which transmits information to the management device (200). The processing unit (120) enables the execution of processing for accepting the registration of the measurement parameters, and when the measurement parameters have been registered, executes processing for transmitting transmission information including information indicating that the measurement parameters have been registered from the transmission unit (126) to the management device (200).

Inventors:

KUWAOKA SHIRO (JP)
NISHIDA TAISUKE (JP)
YAO SHUNSUKE (JP)

Application Number:

PCT/JP2013/001970

Publication Date:

October 03, 2013

Filing Date:

March 22, 2013

Export Citation:

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Assignee:

SYSMEX CORP (JP)
KUWAOKA SHIRO (JP)
NISHIDA TAISUKE (JP)
YAO SHUNSUKE (JP)

International Classes:

G01N35/00

Domestic Patent References:

WO2001067113A1

2001-09-13

Foreign References:

JP2010223735A	2010-10-07
JP2011099679A	2011-05-19
JP2009121821A	2009-06-04
JPH04128657A	1992-04-30
JPH05288756A	1993-11-02
JPH03255366A	1991-11-14
JP2010060431A	2010-03-18
JP2010060431A	2010-03-18

Other References: