Title:
ANALYSIS SYSTEM AND ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2017/038373
Kind Code:
A1
Abstract:
When determining whether or not a predictive determination is made correctly on the basis of the operating state of a device under test during a predetermined time period after the device under test is determined as being inclined to fail, the predictive determination is determined as being incorrect at least when the operating state of the device under test has changed to normal after the device is determined as being inclined to fail, and the predictive determination is determined as being correct when the operating state of the device under test has changed to normal as a result of the execution of a predetermined countermeasure for the device under test after the device under test is determined as being inclined to fail.
Inventors:
MIYAMAE YOSHIO (JP)
KAWAHARA HIROKI (JP)
KAWAHARA HIROKI (JP)
Application Number:
PCT/JP2016/072946
Publication Date:
March 09, 2017
Filing Date:
August 04, 2016
Export Citation:
Assignee:
TLV CO LTD (JP)
International Classes:
G05B23/02
Foreign References:
| JP2006105412A | 2006-04-20 | |||
| JP2012089057A | 2012-05-10 | |||
| JP2001125631A | 2001-05-11 |
Attorney, Agent or Firm:
R&C IP LAW FIRM (JP)
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