Title:
ANALYSIS SYSTEM AND ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2024/018511
Kind Code:
A1
Abstract:
The present invention makes it possible for a worker to specify equipment and work that have high emission amounts. An analysis system according to the present invention comprises a measurement unit that measures consumption/emission amounts for a plurality of processes, a reporting unit that reports the plurality of consumption/emission amounts, a storage device that stores the plurality of consumption/emission amounts, and an analysis unit that analyzes the plurality of consumption/emission amounts and thereby extracts the processes that correspond to consumption/emission amounts that are at or above a first threshold value. A profile is made of information that variably defines the configuration of data to be measured or the measurement method of the data, and the measurement unit sets a measurement unit for the consumption/emission amounts or a measurement method for the consumption/emission amounts on the basis of the profile.
Inventors:
FUJIMOTO KENTA (JP)
FUJITA KOHEI (JP)
IWATSU SATOSHI (JP)
KAI HIROFUMI (JP)
FUJITA KOHEI (JP)
IWATSU SATOSHI (JP)
KAI HIROFUMI (JP)
Application Number:
PCT/JP2022/028016
Publication Date:
January 25, 2024
Filing Date:
July 19, 2022
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G06Q10/06
Domestic Patent References:
| WO2010103659A1 | 2010-09-16 |
Foreign References:
| JP2004302889A | 2004-10-28 | |||
| JP2005025355A | 2005-01-27 | |||
| JP2013003882A | 2013-01-07 | |||
| JP2010008108A | 2010-01-14 | |||
| JP2015199514A | 2015-11-12 |
Attorney, Agent or Firm:
YOSHITAKE Hidetoshi et al. (JP)
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