Title:
ANALYSIS SYSTEM, TRAINED MODEL GENERATING DEVICE, AND DISCRIMINATING SYSTEM, AND ANALYSIS METHOD, TRAINED MODEL GENERATING METHOD, AND DISCRIMINATION METHOD
Document Type and Number:
WIPO Patent Application WO/2022/270606
Kind Code:
A1
Abstract:
Provided are an analysis system, a trained model generating device, and a discriminating system, and an analysis method, a trained model generating method, and a discrimination method for quantifying at least one of an aggregation state and a surface state with high sensitivity. An analysis system (1) according to the present invention includes: an acquiring means (2) for acquiring, by means of an electrical or optical detection method, a signal change over time due to an interaction between a substance being captured and a capture substance; and an analyzing means (3) for analyzing at least one of the aggregation state and the surface state of the substance being captured, from the signal change over time acquired by the acquiring means (2).
Inventors:
OKAMOTO KEN (JP)
SUEMATSU TAKATOSHI (JP)
ONODA WATARU (JP)
TATSUMI ATSURO (JP)
ASAI YUICHIRO (JP)
FURUSAWA NAOKO (JP)
SUEMATSU TAKATOSHI (JP)
ONODA WATARU (JP)
TATSUMI ATSURO (JP)
ASAI YUICHIRO (JP)
FURUSAWA NAOKO (JP)
Application Number:
PCT/JP2022/025204
Publication Date:
December 29, 2022
Filing Date:
June 23, 2022
Export Citation:
Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01N33/543; G01N21/41; G01N21/64; G01N27/414
Domestic Patent References:
| WO2020141463A2 | 2020-07-09 | |||
| WO2016139335A1 | 2016-09-09 | |||
| WO2020047177A1 | 2020-03-05 |
Foreign References:
| JP2013518280A | 2013-05-20 | |||
| US20160327500A1 | 2016-11-10 | |||
| US20100087011A1 | 2010-04-08 | |||
| JP2019215314A | 2019-12-19 | |||
| JP2021504075A | 2021-02-15 |
Attorney, Agent or Firm:
ISONO INTERNATIONAL PATENT OFFICE, P.C. (JP)
Download PDF: