Title:
ANALYSIS SYSTEM, TRAINED MODEL GENERATION DEVICE, DIFFERENTIATION SYSTEM, ANALYSIS METHOD, TRAINED MODEL GENERATION METHOD, AND DIFFERENTIATION METHOD
Document Type and Number:
WIPO Patent Application WO/2022/270043
Kind Code:
A1
Abstract:
Provided are an analysis system, trained model generation device, differentiation system, analysis method, trained model generation method, and differentiation method for quantifying, with high sensitivity, at least one from among an aggregation state and surface state. An analysis system (1) according to this invention comprises an acquisition means (2) for using an electrical or optical detection method to acquire signal variation over time resulting from the interaction between a captured substance and a capturing substance and an analysis means (3) for analyzing at least one from among the aggregation state and surface state of the captured substance from the signal variation over time acquired by the acquisition means (2).
Inventors:
OKAMOTO KEN (JP)
SUEMATSU TAKATOSHI (JP)
ONODA WATARU (JP)
TATSUMI ATSURO (JP)
ASAI YUICHIRO (JP)
FURUSAWA NAOKO (JP)
SUEMATSU TAKATOSHI (JP)
ONODA WATARU (JP)
TATSUMI ATSURO (JP)
ASAI YUICHIRO (JP)
FURUSAWA NAOKO (JP)
Application Number:
PCT/JP2022/011374
Publication Date:
December 29, 2022
Filing Date:
March 14, 2022
Export Citation:
Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01N33/543; G01N21/41; G01N21/64; G01N27/414
Domestic Patent References:
| WO2020141463A2 | 2020-07-09 |
Foreign References:
| JP2013518280A | 2013-05-20 | |||
| US20160327500A1 | 2016-11-10 | |||
| JP2019215314A | 2019-12-19 | |||
| JP2021504075A | 2021-02-15 |
Attorney, Agent or Firm:
ISONO INTERNATIONAL PATENT OFFICE, P.C. (JP)
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