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Title:
ANALYTE MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2016/076284
Kind Code:
A1
Abstract:
This analyte measurement device 10 is provided with: a laser diode 16a for irradiating with a laser beam a measurement sample prepared from an analyte; a detection unit 120 for acquiring optical information from particles in the measurement sample irradiated with the laser beam; a drive circuit 13 for presenting a DC drive signal to the laser diode 16a; and a high-frequency conversion circuit 14 for generating a potential that repeatedly cycles through a high level and a low level in a prescribed cycle, whereby the drive signal outputted by the drive circuit 13 is guided in a prescribed cycle onto a second signal path 103 different from a first signal path 102 connected to the laser diode 16a, and the drive signal presented to the laser diode 16a is converted to high frequency.

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Inventors:
MATSUI KUNIHIKO (JP)
TAMURA AKIKO (JP)
Application Number:
PCT/JP2015/081533
Publication Date:
May 19, 2016
Filing Date:
November 10, 2015
Export Citation:
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Assignee:
SYSMEX CORP (JP)
International Classes:
G01N21/64; G01N15/14
Foreign References:
JP2009053020A2009-03-12
JP2001067706A2001-03-16
JPH09178645A1997-07-11
JP2012215458A2012-11-08
JP2007200494A2007-08-09
Other References:
See also references of EP 3220129A4
Attorney, Agent or Firm:
SHIBANO, Masanori (JP)
Shibano right -- elegant (JP)
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