The present invention relates to mass spectrometry apparatus and a method use of said apparatus.

Although the following description refers exclusively to a mass spectrometry system with a DART (Direct Analysis in Real Time) source, the person skilled in the art will appreciate that the present invention could be applied to mass spectrometry systems with different ion sources.

Ambient or direct analysis mass spectrometry techniques are known. These techniques usually require little or no sample preparation. Therefore, solid and liquid materials can be analysed by mass spectrometry in their native state. Ionization can take place directly on the sample surface, by exposing the same to the DART ion source. Vapour ejected is introduced directly into the DART gas stream.

The spectra produced are relatively simple, however the data does not include any information regarding sample surface morphology, particularly as a function of time and/ or temperature.

It is therefore an aim of the present invention to provide an apparatus for use with a mass spectrometer that addresses the abovementioned problems.

It is a further aim of the present invention to provide a mass spectrometer that addresses the abovementioned problems.

It is a yet further aim of the present invention to provide a method of analysis that addresses the abovementioned problems.

In a first aspect of the invention there is provided an apparatus for use with a mass spectrometry system, said apparatus including a microscope and at least one stage for the location of samples, wherein the at least one stage is positioned or located between an atmospheric pressure ion source and a mass spectrometer inlet or entrance.

Thus at least the sample stage is positioned adjacent to the ion source such that the ion stream contacts the sample in use and passes into the mass spectrometer entrance or inlet.

Preferably the ion source is a Direct Analysis in Real Time (DART) source.

In one embodiment the ion source is an ambient ion source. Typically the ambient ion source is a Desorption Electrospray Ionization (DESI) ion source.

Preferably the stage or platform is a hot stage. Typically the hot stage is modified such that the temperature of the stage and/ or the sample thereon in use can be controlled. Further typically the stage and/or the sample thereon can be heated to around or to 600 °C.

Typically the temperature of the hot stage and/ or the sample thereon can be maintained or heated to a temperature from ambient or room temperature .to 600 °C.

In one embodiment the hot stage and/ or sample thereon can be cooled to below ambient and/ or below room temperature.

Preferably the microscope is a digital microscope. Further preferably the microscope is a hot stage microscope.

In one embodiment the microscope is an infrared microscope.

In a second aspect of the invention there is provided a mass spectrometry apparatus for the analysis of one or more samples, said apparatus including a source and a mass spectrometer including an inlet to the same wherein the apparatus includes a microscope and stage or platform for the location of one or more samples thereon in use, said stage or platform positioned or located between the ion source and the mass spectrometer inlet.

Typically the temperature controlled sample stage is located intermediate the ion source and the mass spectrometer inlet. Further typically the sample stage is sandwiched between and/ or is flanked by the source and the inlet.

In a third aspect of the invention there is provided a method of analysing a sample by mass spectrometry, said method including the step of placing a sample stage and/or a sample in use between the ion source and the mass spectrometer inlet.

In a further aspect of the invention there is provided an apparatus including a mass spectrometer ion source located adjacent a microscope stage wherein the temperature or the stage can be controlled and/ or predetermined.

Typically the temperature of the stage is predetermined. Further typically the temperature of the stage varies over a predetermined period of time. In one embodiment the temperature of the stage is programmable such that is follows a temperature profile whereby the temperature varies as a function of time.

A specific embodiment of the invention is now described with reference to the following figures wherein:

Figure 1 shows a schematic view of the side of one embodiment of the invention.

The present invention is embodied in a hot-stage microscope direct analysis in real time mass spectrometry system (HSM-D ART-MS). This apparatus allows the analysis of pharmaceutical formulations, polymers, small molecules and/or the like. It expands the range of materials to which DART-MS analysis can be applied. It is also a combined technique allowing visualisation and on-line chemical characterisation of thermal processes. Turning to figure 1 wherein there is shown an HSM-D ART-MS apparatus 2, which includes on one side a DART source 4 and the MS inlet 6 on the opposite side. The sample stage 8 is located between the source 4 and the inlet 6 with a digital microscope 10 positioned substantially above or above the sample stage 8. In use, the sample 12 is placed on the stage and a beam of ions or excited particles is fired or directed towards the sample. After contact with the sample the excited particles or ions ejected from the sample are drawn into the MS inlet, usually by the application of a vacuum.

The temperature of the stage can be varied or programmed with a particular range of temperatures or a profile. This any phase changes, such as localised phase changes, or any other such changes in morphology or structure and be observed and/ or investigated.