ANALYTICAL APPARATUS AND ANALYTICAL METHOD

WIPO Patent Application WO/2012/008129

A1

Disclosed is a flow site meter using a spectroscopic means and a multi-detector, wherein setting of an optimum wavelength band prior to measuring fluorescence intensity in real time is supported. A signal processing means stores the intensities in a plurality of wavelength bands, said intensities being obtained by measuring a calibration sample, and the distribution of the intensities is calculated and displayed by each of the wavelength bands.

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MITSUYAMA, Satoshi (HITACHI LTD., 280, Higashikoigakubo 1-chome, Kokubunji-sh, Tokyo 01, 〒1858601, JP)
光山　訓 (〒01 東京都国分寺市東恋ヶ窪一丁目２８０番地　株式会社日立製作所　中央研究所内 Tokyo, 〒1858601, JP)
OWADA, Norio (HITACHI HIGH-TECHNOLOGIES CORPORATION 882, Oaza Ichige, Hitachinaka-sh, Ibaraki 04, 〒3128504, JP)
大和田　伯男 (〒04 茨城県ひたちなか市大字市毛８８２番地　株式会社日立ハイテクノロジーズ　那珂事業所内 Ibaraki, 〒3128504, JP)

JP2011/003917

January 19, 2012

July 08, 2011

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HITACHI HIGH-TECHNOLOGIES CORPORATION (24-14, Nishi Shimbashi 1-chome Minato-k, Tokyo 17, 〒1058717, JP)
株式会社日立ハイテクノロジーズ (〒17 東京都港区西新橋一丁目２４番１４号 Tokyo, 〒1058717, JP)
MITSUYAMA, Satoshi (HITACHI LTD., 280, Higashikoigakubo 1-chome, Kokubunji-sh, Tokyo 01, 〒1858601, JP)
光山　訓 (〒01 東京都国分寺市東恋ヶ窪一丁目２８０番地　株式会社日立製作所　中央研究所内 Tokyo, 〒1858601, JP)
OWADA, Norio (HITACHI HIGH-TECHNOLOGIES CORPORATION 882, Oaza Ichige, Hitachinaka-sh, Ibaraki 04, 〒3128504, JP)

G01N21/64; G01N15/14

INOUE, Manabu et al. (6-1, Marunouchi 1-chome, Chiyoda-k, Tokyo 20, 〒1008220, JP)

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