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Title:
ANALYZER AND ANALYZING METHOD
Document Type and Number:
WIPO Patent Application WO/2007/007849
Kind Code:
A1
Abstract:
In an analyzer for measuring a substance to be inspected in a liquid sample, high precision measurement is impossible because the reliability of measurement degrades because of the influence of the properties of the liquid sample and an analyzing element. The analyzer comprises a section for measuring a signal generated by a reaction of the substance to be inspected in a liquid sample, a section for collecting parameters indicative of the degree of influence on measurement error from the liquid sample developed in a channel on the analyzing element, a section for previously holding an algorithm consisting of the relation among the parameters, the signal and the true value of the substance to be inspected, and a section for computing the analysis value of the substance to be inspected from the signal according to the parameters. The computing section reads out the algorithm and determines the analysis value of the substance to be inspected in which measurement error is corrected according to the parameters collected by the parameter collecting section using the algorithm thus read out.

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Inventors:
KAWAMATA RYOKO
TAKAHASHI MIE
Application Number:
PCT/JP2006/314001
Publication Date:
January 18, 2007
Filing Date:
July 13, 2006
Export Citation:
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Assignee:
MATSUSHITA ELECTRIC IND CO LTD (JP)
KAWAMATA RYOKO
TAKAHASHI MIE
International Classes:
G01N33/52; G01N21/78; G01N33/543
Domestic Patent References:
WO1999060391A11999-11-25
WO2002025253A12002-03-28
WO2003056312A12003-07-10
Foreign References:
JPH0875748A1996-03-22
JP2001091512A2001-04-06
JP3586743B22004-11-10
JP2000262298A2000-09-26
JP2001091512A2001-04-06
JPH0875748A1996-03-22
Other References:
See also references of EP 1909103A4
Attorney, Agent or Firm:
HAYASE, Kenichi (The Sumitomo Building No.2 4-7-28 Kitahama, Chuo-k, Osaka-shi Osaka 41, JP)
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