ANOMALY DIAGNOSTIC DEVICE AND INDUSTRIAL MACHINE

Title:

ANOMALY DIAGNOSTIC DEVICE AND INDUSTRIAL MACHINE

Document Type and Number:

WIPO Patent Application WO/2012/057001

Kind Code:

A1

Abstract:

Provided is an anomaly diagnostic device, as well as an industrial machine provided with the anomaly diagnostic device, which, when performing state diagnostics of a machine or an apparatus on the basis of time-series data generated by a sensor, can improve the accuracy of diagnosis even if the computer disposed upon the machine side does not have sufficient processing capability, and for which the amount of communication data is decreased so as to reduce the volume of communication. A machine-side diagnostic device (2) diagnoses time-series data generated by the sensor to acquire a primary diagnostic result and extracts the time-series data relating to the primary diagnostic result so as to output thereof together with the primary diagnostic result to a server-side diagnostic device (3), whereupon the server-side diagnostic device (3) diagnoses the time-series data to acquire a secondary diagnostic result and displays the secondary diagnostic result together with the primary diagnostic result. In addition, the diagnostic results are compared, and if the comparison results are different, the diagnostic processing of the machine-side diagnostic device (2) is updated.

Inventors:

SUZUKI HIDEAKI (JP)
NAKAMURA KOZO (JP)
YUDA SHINYA (JP)
UCHIYAMA HIROKI (JP)

Application Number:

PCT/JP2011/074218

Publication Date:

May 03, 2012

Filing Date:

October 20, 2011

Export Citation:

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Assignee:

HITACHI LTD (JP)
SUZUKI HIDEAKI (JP)
NAKAMURA KOZO (JP)
YUDA SHINYA (JP)
UCHIYAMA HIROKI (JP)

International Classes:

G05B23/02

Foreign References:

JP2008176404A	2008-07-31
JP2002006942A	2002-01-11
JP2003015734A	2003-01-17
JP2009200208A	2009-09-03
JP2005043138A	2005-02-17

Other References: