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Patent Searching and Data


Title:
APPARATUS FOR CUTTING SPECIMENS FOR MICROSCOPIC EXAMINATION
Document Type and Number:
WIPO Patent Application WO/2019/156884
Kind Code:
A3
Abstract:
Cutting apparatuses comprising: a base; a first platen and a second platen that are coupled to the base and that are configured to hold a specimen, wherein the first platen includes a first cutting surface and the second platen includes a second cutting surface; a moveable carriage that is moveably coupled to the base; a cutting arm that is pivotably coupled at a pivot point to the carriage and that is configured to hold a cutting blade; and a spring coupled to the arm so as to apply a directional force to the arm and the blade, wherein the moveable carriage can be moved in a manner that causes the blade to slide on at least one of the first cutting surface and the second cutting surface while being pressed against the at least one of the first cutting surface and the second cutting surface by the directional force.

Inventors:
PUTMAN MATTHEW (US)
PUTMAN JOHN (US)
JAIME ALEJANDRO (US)
GRIFFITH RANDOLPH (US)
Application Number:
PCT/US2019/016029
Publication Date:
April 30, 2020
Filing Date:
January 31, 2019
Export Citation:
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Assignee:
NANOTRONICS IMAGING INC (US)
International Classes:
G01N1/06; B26D7/26; G01N1/02; G01N1/04
Foreign References:
US3872759A1975-03-25
US3496819A1970-02-24
US3420130A1969-01-07
US5161446A1992-11-10
US6601488B12003-08-05
US20080118312A12008-05-22
US5282404A1994-02-01
Attorney, Agent or Firm:
BYRNE, Matthew, T. et al. (US)
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