APPARATUS DIAGNOSTIC DEVICE, SYSTEM, AND METHOD

WIPO Patent Application WO/2017/090515

A1

An objective of the present invention is to estimate factors such as apparatus faults, sensor faults, or false positives, with respect to sensed malfunctions. An apparatus diagnostic system (100) according to the present invention comprises: a malfunction sensing unit (102) which receives sensor signal data from a sensor which is installed upon an apparatus, and carries out a malfunction determination by comparing said sensor signal data with regular operation data; a known fault determination unit (103) which assesses for a known fault by making a comparison with apparatus fault data; a regular operation data sufficiency estimation unit (108) which estimates the sufficiency of the regular operation data on the basis of the quantity of types and the accumulation situation of the regular operation data; an apparatus fault data sufficiency estimation unit (109) which estimates the sufficiency of the apparatus fault data on the basis of the quantity of types and the accumulation situation of the apparatus fault data; and a malfunction sensing information provision unit (111) which provides malfunction sensing information, indicating for example that there is the possibility of a false positive if the regular operation data is insufficient or the possibility of a previously unknown fault if the apparatus fault data is insufficient.

ISHIDA KYOKO (JP)
UCHIDA TAKAYUKI (JP)
SAKIMURA SHIGETOSHI (JP)
FUJISHIRO TAKAHIRO (JP)
ATARASHI YOSHITAKA (JP)

PCT/JP2016/084193

June 01, 2017

November 18, 2016

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HITACHI LTD (JP)

G05B23/02; G01M99/00

JP2013008098A	2013-01-10
JPH10228310A	1998-08-25

TODA Yuji (JP)

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