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Patent Searching and Data


Title:
APPARATUS FOR MEASURING POSITION OF PROBE FOR INCLINOMETER, AND PROBE
Document Type and Number:
WIPO Patent Application WO/2016/117810
Kind Code:
A1
Abstract:
Disclosed are an apparatus for measuring a position of a probe for an inclinometer, and a probe. The apparatus for measuring a position of a probe for an inclinometer comprises: a probe connection unit; a cable connection unit; a storage unit; a power supply unit; a magnetic field generator; a rotational speed calculation unit, and a probe position calculation unit. The probe connection unit is connected to a probe in which a displacement measurement sensor for measuring a displacement of the ground is installed. The cable connection unit is connected to a cable for moving the probe inside an inclinometer tube. The storage unit stores a measurement value measured by the displacement measurement sensor. The power supply unit supplies power to the displacement measurement sensor. The magnetic field generator is formed in a partial region of a rotating body which rotates and moves while adjoining the inner surface of the inclinometer tube, and generates a magnetic field while rotating according to the rotation of the rotating body. The rotational speed calculation unit calculates the number of revolutions of the rotating body by measuring the generated magnetic field. The probe position calculation unit calculates the position of the probe using the calculated number of revolutions.

Inventors:
LEE KEUN HO (KR)
Application Number:
PCT/KR2015/012039
Publication Date:
July 28, 2016
Filing Date:
November 10, 2015
Export Citation:
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Assignee:
LEE KEUN HO (KR)
International Classes:
G01C9/02; G01D5/12; G08C17/02
Foreign References:
JP2013096814A2013-05-20
JPH11304430A1999-11-05
JPH10115627A1998-05-06
JP3150355U2009-05-07
JP2000283800A2000-10-13
Attorney, Agent or Firm:
B&IP-JOOWON PATENT AND LAW FIRM (KR)
특허법인 주원 (KR)
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