Title:
APPARATUS AND METHOD FOR DETERMINING MATERIAL PROPERTIES OF A POLYCRYSTALLINE PRODUCT
Document Type and Number:
WIPO Patent Application WO/2020/260336
Kind Code:
A8
Abstract:
The invention relates to a method and an apparatus for determining the material properties of a polycrystalline, in particular metallic, product (1) during the production or quality control of the polycrystalline, in particular metallic, product (1), by means of x-ray diffraction using at least one x-ray source (11) and at least one x-ray detector (13). X-ray radiation (15) generated by the x-ray source (11) is directed at a surface (2) of the polycrystalline product (1) and the diffraction image (16) of the x-ray radiation (15) resulting therefrom is recorded by the x-ray detector (13). After exiting the x-ray source (11), the x-ray radiation (15) is guided by an x-ray mirror (17), wherein the x-ray radiation (15) is focused both monochromatically and in the direction of the polycrystalline product (1) and/or of the x-ray detector (13) by the x-ray mirror (17) and said x-ray radiation subsequently impinges on a surface (2) of the metallic product (1).
Inventors:
KLINKENBERG CHRISTIAN (DE)
SOMMERS ULRICH (DE)
KLEIN HELMUT (DE)
LHOEST ALEXANDRE (BE)
PENSIS OLIVIER (BE)
KRAUTHAEUSER HORST (DE)
SOMMERS ULRICH (DE)
KLEIN HELMUT (DE)
LHOEST ALEXANDRE (BE)
PENSIS OLIVIER (BE)
KRAUTHAEUSER HORST (DE)
Application Number:
PCT/EP2020/067593
Publication Date:
June 10, 2021
Filing Date:
June 24, 2020
Export Citation:
Assignee:
SMS GROUP GMBH (DE)
IMS MESSSYSTEME GMBH (DE)
IMS MESSSYSTEME GMBH (DE)
International Classes:
G01N23/20008
Attorney, Agent or Firm:
KROSS, Ulrich (DE)
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