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Title:
APPARATUS AND METHOD FOR IMAGE ANALYSIS USING VIRTUAL THREE-DIMENSIONAL DEEP NEURAL NETWORK
Document Type and Number:
WIPO Patent Application WO/2018/174623
Kind Code:
A1
Abstract:
Disclosed are an apparatus and a method for image analysis using a virtual three-dimensional deep neural network. The apparatus for image analysis comprises: an image acquisition unit for stacking a plurality of two-dimensional image data in a predetermined order; a three-dimensional image generation unit for generating a plurality of three-dimensional data on the basis of different types of multiple items of information for the plurality of two-dimensional image data in a stacked form from the image acquisition unit; and a deep learning algorithm analysis unit for applying a two-dimensional convolutional neural network to each of the plurality of three-dimensional data from the three-dimensional image generation unit, and combining results of applying the two-dimensional convolutional neural network to the plurality of three-dimensional data.

Inventors:
KIM, Dongmin (7-3 Bonggok-ro 6-gil, Gumi-si, Gyeongsangbuk-do, 39210, KR)
BACK, Jonghwan (101-306, 10 Daegongwon-ro 115beon-gil,,Nam-gu, Ulsan, 44664, KR)
LEE, Myung Jae (110-902, 29 Hakdong-ro 68-gil,,Gangnam-gu, Seoul, 06090, KR)
SON, Jisoo (1-401, 16 Jangseungnam-ro 81beon-gil,,Namdong-gu, Incheon, 21593, KR)
KANG, Shin Uk (402-1602, 221 Seolleung-ro,,Gangnam-gu, Seoul, 06276, KR)
KIM, Tae Won (730-404, 366 Maeyeong-ro, Yeongtong-gu,,Suwon-si, Gyeonggi-do, 16701, KR)
KIM, Dong-Eog (120-803, 270 Sinbanpo-ro,,Seocho-gu, Seoul, 06544, KR)
Application Number:
KR2018/003404
Publication Date:
September 27, 2018
Filing Date:
March 23, 2018
Export Citation:
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Assignee:
JLK INSPECTION (#302, 40 Yeongudanji-ro, Ochang-eup, Cheongwon-gu,,Cheongju-si, Chungcheongbuk-do, 28116, KR)
International Classes:
G06T17/30; G06N3/08; G06T3/00; G06T3/40; G06T3/60
Foreign References:
KR20160101973A2016-08-26
JP2000105838A2000-04-11
KR20160061856A2016-06-01
KR20160122452A2016-10-24
Other References:
LEE, BEOM-JIN ET AL.: "RGB-D-T Face Recognition Using Convolutional-recursive Deep Learning", 2014 KOREAN INSTITUTE OF INFORMATION SCIENTISTS AND ENGINEERS THE 41 ST ANNUAL MEETING AND WINTER CONFERENCE, December 2014 (2014-12-01), pages 616 - 618, XP009516851
TTH, BLINT PI ET AL.: "Deep Learning and SVM Classification for Plant Recognition in Content-Based Large Scale Image Retrieval", WORKING NOTES OF CLEF 2016-CONFERENCE AND LABS OF THE EVALUATION FORUM, 5 September 2016 (2016-09-05), pages 569 - 578, XP055559756
Attorney, Agent or Firm:
KIM, In Han (10F Shinyoung bldg, . 26 Saimdang-ro,,Seocho-gu, Seoul, 06651, KR)
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