Title:
APPARATUS AND METHOD FOR MEASURING CONTACT QUALITY OF NEGATIVE PLATE OF HIGH-FREQUENCY ELECTROTOME
Document Type and Number:
WIPO Patent Application WO/2019/109334
Kind Code:
A1
Abstract:
An apparatus and method for measuring the contact quality of a negative plate (3) of a high-frequency electrotome device. The measurement apparatus comprises: first and second impedance measurement circuits (1, 2) for measuring, by means of excitation, equivalent contact impedances (R1, R2) between first and second negative plates and a tested human body, converting measured first and second impedance signals into first and second standard sine wave analog signals and inputting same into first and second operational amplification/AD modules; the first and second operational amplification/AD modules for performing amplification and AD conversion processing on the standard sine wave analog signals input by the first and second impedance measurement circuits (1, 2), and inputting first and second digital signals after processing into a system microcontroller unit (MCU); and the system microcontroller unit (MCU) for calculating the input first and second digital signals, and obtaining the contact quality of the negative plate (3) of a high-frequency electrotome device by means of analysis.
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Inventors:
HUANG WENXING (CN)
LU WEN (CN)
LU WEN (CN)
Application Number:
PCT/CN2017/115223
Publication Date:
June 13, 2019
Filing Date:
December 08, 2017
Export Citation:
Assignee:
SURGNOVA HEALTHCARE TECH ZHEJIANG CO LTD (CN)
International Classes:
G01R27/02; A61B18/12; A61B18/16
Foreign References:
| CN107907744A | 2018-04-13 | |||
| CN203117291U | 2013-08-07 | |||
| CN206587032U | 2017-10-27 | |||
| CN102215768A | 2011-10-12 | |||
| US5087257A | 1992-02-11 | |||
| US20100036377A1 | 2010-02-11 |
Attorney, Agent or Firm:
CHINA SCIENCE PATENT & TRADEMARK AGENT LTD. (CN)
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