Title:
APPARATUS AND METHOD FOR MEASURING DYNAMIC ON-RESISTANCE OF NITRIDE-BASED SWITCHING DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/164900
Kind Code:
A1
Abstract:
The present disclosure provides an apparatus for measuring dynamic on-resistance of a nitride-based device under test (DUT) comprising a control terminal connected to a controller being configured to generate a control signal to switch on and off the DUT. The apparatus comprising a first clamping module, a second clamping module and a driving module. The driving module is configured to sense a state change of the DUT and generate a control signal to switch on and off the first clamping module based on the state change of the DUT such that when the DUT is at an on-state, an output voltage across the first and second output nodes is clamped to indicate a drain-source voltage of the DUT. The provided apparatus can address the overshoot issues in measurement of dynamic on-resistance of GaN device.
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Inventors:
CHEN CHANG (CN)
Application Number:
PCT/CN2022/079106
Publication Date:
September 07, 2023
Filing Date:
March 03, 2022
Export Citation:
Assignee:
INNOSCIENCE SUZHOU SEMICONDUCTOR CO LTD (CN)
International Classes:
G01R27/02; G01R31/26; H03K17/687
Foreign References:
| CN110174603A | 2019-08-27 | |||
| JP2000171517A | 2000-06-23 | |||
| CN108718150A | 2018-10-30 | |||
| CN111426928A | 2020-07-17 | |||
| CN113595047A | 2021-11-02 | |||
| CN103760408A | 2014-04-30 | |||
| US20150381148A1 | 2015-12-31 | |||
| CN112394228A | 2021-02-23 | |||
| CN105811765A | 2016-07-27 |
Attorney, Agent or Firm:
BEIJING BESTIPR INTELLECTUAL PROPERTY LAW CORPORATION (CN)
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