Title:
APPARATUS AND METHOD FOR MEASURING STRAIGHTNESS
Document Type and Number:
WIPO Patent Application WO/2017/146330
Kind Code:
A1
Abstract:
Disclosed is an apparatus and method for measuring straightness. The disclosed method for measuring straightness comprises the steps of: acquiring photographed images by photographing a reference line marked on an object while changing a photographing position along a processing direction of the object; and measuring straightness in the processing direction from positions of the reference line appearing in the photographed images, wherein, in the step of acquiring the photographed images, the line width of the reference line appearing in the photographed images is smaller than the resolution of a photographing unit.
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Inventors:
HUR JEEN (KR)
Application Number:
PCT/KR2016/010140
Publication Date:
August 31, 2017
Filing Date:
September 09, 2016
Export Citation:
Assignee:
EO TECHNICS CO LTD (KR)
International Classes:
G01B11/04; B23K26/03; B23Q17/24; G01B11/06; G01B11/10
Foreign References:
| JP2014021042A | 2014-02-03 | |||
| KR20110117371A | 2011-10-27 | |||
| KR20110018074A | 2011-02-23 | |||
| KR20120119029A | 2012-10-30 | |||
| KR19990051083A | 1999-07-05 |
Attorney, Agent or Firm:
Y.P.LEE, MOCK & PARTNERS (KR)
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