Title:
APPARATUS AND METHOD FOR MEASURING SURFACE TENSION
Document Type and Number:
WIPO Patent Application WO/2017/014608
Kind Code:
A1
Abstract:
A surface tension measurement apparatus according to an embodiment of the present invention comprises: at least one cell into which insulating liquid is embedded while covering an electrode; a power source unit for applying a voltage to the electrode; a measuring unit for measuring the bottom of a interface between the insulating liquid and non-insulating liquid, which varies with the voltage applied to the electrode; and a calculation unit for calculating the surface tension of the interface on the basis of the bottom of the interface.
Inventors:
LEE JUNGHOON (KR)
CHOI SEUNGYUL (KR)
CHOI SEUNGYUL (KR)
Application Number:
PCT/KR2016/008095
Publication Date:
January 26, 2017
Filing Date:
July 25, 2016
Export Citation:
Assignee:
UNIV SEOUL NAT R & DB FOUND (KR)
International Classes:
G01N13/02; G01B21/08; G01B21/16; G01R27/26
Domestic Patent References:
| WO2008110560A1 | 2008-09-18 |
Foreign References:
| KR20130078841A | 2013-07-10 | |||
| JP2010078603A | 2010-04-08 |
Other References:
CHOI, SEUAGYUL ET AL.: "Surface Tension Monitoring in a 'Soft' Interface Using Electrowetting on Dielectric", MEMS, vol. 27th, 2014, XP032578987
VAFAEL SAEID ET AL.: "The Effect of Nanoparticles on the Liquid-gas Surface Tension of Bi2Te3 Nanofluids", NANOTECHNOLOGY, vol. 20, no. 18, 15 April 2009 (2009-04-15), XP020152928
VAFAEL SAEID ET AL.: "The Effect of Nanoparticles on the Liquid-gas Surface Tension of Bi2Te3 Nanofluids", NANOTECHNOLOGY, vol. 20, no. 18, 15 April 2009 (2009-04-15), XP020152928
Attorney, Agent or Firm:
ISQUARE PATENT & LAW FIRM (KR)
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