Title:
APPARATUS AND METHOD FOR TESTING ELECTRONIC EQUIPMENT
Document Type and Number:
WIPO Patent Application WO/2013/028634
Kind Code:
A3
Abstract:
A thermal wrap for testing electronic components has a web having an inside and an outside surface and a first end and a second end and a thermal element incorporated in said web. An edge element incorporated substantially along at least one edge of said web promotes a thermal seal between said web and the electronic component being tested when the electronic component in installed in the wrap. A closure disposed on the ends may be reversibly closed sufficiently tightly to promote the thermal seal.
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Inventors:
ALBERT GLENN D (US)
Application Number:
PCT/US2012/051616
Publication Date:
May 08, 2014
Filing Date:
August 20, 2012
Export Citation:
Assignee:
TELEPLAN INTERNAT NV (US)
ALBERT GLENN D (US)
ALBERT GLENN D (US)
International Classes:
G01K1/14
Foreign References:
| US4785136A | 1988-11-15 | |||
| US20090282455A1 | 2009-11-12 | |||
| US6740607B2 | 2004-05-25 | |||
| US5562027A | 1996-10-08 |
Attorney, Agent or Firm:
RUSCHE, H., Frederick (190 Carondelet PlazaSuite 60, St. Louis MO, US)
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