Title:
APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR DEVICE BY USING FREQUENCY OUTPUT PROPERTIES OF SEMICONDUCTOR DEVICE AND MACHINE LEARNING
Document Type and Number:
WIPO Patent Application WO/2021/096076
Kind Code:
A1
Abstract:
The present invention relates to a technology for testing a semiconductor device by means of machine learning of the frequency output properties of a semiconductor device, and more specifically relates to technology that increases the test accuracy of a determination of the condition of a semiconductor device by measuring the waves of a current or voltage output via a semiconductor device, applying an MFCC-based filter to the measured waves, and thereby constructing a database using two dimensional array data of vector data, and carrying out machine learning with respect to the constructed database.
Inventors:
KIM GYU TAE (KR)
LEE KOOK JIN (KR)
NAM SANG JIN (KR)
LEE KOOK JIN (KR)
NAM SANG JIN (KR)
Application Number:
PCT/KR2020/014011
Publication Date:
May 20, 2021
Filing Date:
October 14, 2020
Export Citation:
Assignee:
UNIV KOREA RES & BUS FOUND (KR)
International Classes:
G01R31/317; G01R23/16; G06N20/00
Foreign References:
| JP2007155538A | 2007-06-21 | |||
| KR102014751B1 | 2019-08-28 | |||
| KR101967065B1 | 2019-04-08 | |||
| JP2018036113A | 2018-03-08 | |||
| KR101299183B1 | 2013-08-22 |
Attorney, Agent or Firm:
KIM, Youn Gwon (KR)
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