Title:
APPARATUS AND SYSTEM FOR MEASURING AIR QUALITY
Document Type and Number:
WIPO Patent Application WO/2021/242027
Kind Code:
A1
Abstract:
The present invention provides an apparatus for measuring air quality, the apparatus comprising: a light scattering measurement unit that measures a first current on the basis of scattered light that is scattered by emitting light into air from which suspended particulates have been filtered; an alpha ray ionization measurement unit that measures an ionized second current by emitting alpha rays into the air; a beta ray ionization measurement unit that measures an ionized third current by emitting beta rays into the air; and a data processing unit that, on the basis of first to third proportional constant set values that are set by calculating concentrations of air, fine dust, and moisture within a standard chamber, determines a first concentration of the fine dust and a second concentration of the moisture with respect to the first to third currents, and determines a final concentration of the fine dust by performing machine learning/deep learning calculations on measurement errors of the first and second concentrations.
Inventors:
KIM SANG IN (KR)
YUN EUN JUNG (KR)
YUN EUN JUNG (KR)
Application Number:
PCT/KR2021/006609
Publication Date:
December 02, 2021
Filing Date:
May 27, 2021
Export Citation:
Assignee:
ARIM SCIENCE CO (KR)
International Classes:
G01N15/02; G06N3/08
Foreign References:
| KR20180041828A | 2018-04-25 | |||
| KR20180065588A | 2018-06-18 | |||
| KR20110121810A | 2011-11-09 | |||
| KR20160106908A | 2016-09-13 | |||
| KR20160121151A | 2016-10-19 | |||
| KR102148812B1 | 2020-08-28 |
Attorney, Agent or Firm:
CHOI, Kue Sung (KR)
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