Title:
APPARATUS FOR X-RAY INSPECTION OF MULTI-POINT INSPECTION METHOD, AND METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2021/095937
Kind Code:
A1
Abstract:
The present invention relates to an apparatus for x-ray inspection of multi-point inspection method, and a method therefor. The apparatus for X-ray inspection comprises: a first guide path (12) connected to the outside of an inspection room (R) to guide an article (A) to a first inspection position; at least one first inspection module disposed at the first inspection position formed in the first guide path (12) to perform an inspection on at least one inspection point of an article (B); at least one inspection connection path (16a, 16b) guiding the article (B) that has been inspected in the first guide path (12) to a second inspection position; at least one second inspection module disposed at the second inspection position formed in the inspection connection paths (16a, 16b) to perform an inspection on at least one other inspection point of the article (B); and a second guide path (15) connecting the second inspection position and the outside of the inspection room (R).
Inventors:
KIM HYEONG-CHEOL (KR)
JANG YONG-HAN (KR)
GO YOUNG-BOK (KR)
LEE JAE-DONG (KR)
LEE TAE-YUN (KR)
KIM YEONG-NAM (KR)
JANG YONG-HAN (KR)
GO YOUNG-BOK (KR)
LEE JAE-DONG (KR)
LEE TAE-YUN (KR)
KIM YEONG-NAM (KR)
Application Number:
PCT/KR2019/015637
Publication Date:
May 20, 2021
Filing Date:
November 15, 2019
Export Citation:
Assignee:
XAVIS CO LTD (KR)
International Classes:
G01N23/04; G01N23/083; H01M10/48
Foreign References:
| KR100982025B1 | 2010-09-14 | |||
| KR20160068414A | 2016-06-15 | |||
| KR20170016179A | 2017-02-13 | |||
| KR101133048B1 | 2012-04-04 | |||
| US20020166802A1 | 2002-11-14 |
Attorney, Agent or Firm:
YANG, Jeong-Kun (KR)
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