Title:
ARRAY-BASED DEPTH ESTIMATION
Document Type and Number:
WIPO Patent Application WO/2022/025741
Kind Code:
A1
Abstract:
A method comprises obtaining a plurality of image frames, the plurality of image frames comprising a reference image frame and a plurality of non-reference image frames; generating a first disparity map based on the reference image frame and a first non-reference image frame; generating a second disparity map based on the reference image frame and a second non-reference image frame; generating, based on the first disparity map, a first confidence map comprising a first plurality of confidence levels associated with a first plurality of disparity values of the first disparity map; generating, based on the second disparity map, a second confidence map comprising a second plurality of confidence levels associated with a second plurality of disparity values of the second disparity map; and generating a depth map of the scene based on the first disparity map, the second disparity map, the first confidence map and the second confidence map.
Inventors:
LUO CHENCHI (US)
LI YINGMAO (US)
LIN KAIMO (US)
YOO YOUNGJUN (US)
LI YINGMAO (US)
LIN KAIMO (US)
YOO YOUNGJUN (US)
Application Number:
PCT/KR2021/095070
Publication Date:
February 03, 2022
Filing Date:
June 01, 2021
Export Citation:
Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
G06T7/593; G06N3/08; G06T3/40; H04N13/271
Foreign References:
| US20140321712A1 | 2014-10-30 | |||
| US20130129194A1 | 2013-05-23 | |||
| US20150071524A1 | 2015-03-12 | |||
| US20120321172A1 | 2012-12-20 | |||
| KR20160083905A | 2016-07-12 |
Attorney, Agent or Firm:
Y.P.LEE, MOCK & PARTNERS (KR)
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