Title:
ARRAY SUBSTRATE TEST KEY AND DISPLAY PANEL
Document Type and Number:
WIPO Patent Application WO/2020/232795
Kind Code:
A1
Abstract:
The present invention provides an array substrate test key and a display panel. The array substrate test key sequentially comprises a glass substrate, a multi-buffer layer, a gate insulating layer, a gate layer, a source/drain electrode layer, an indium tin oxide layer, and a flat organic layer from bottom to top, and further comprises a semiconductor layer; the semiconductor layer is provided between the multi-buffer layer and the gate insulating layer and can absorb a part of static electricity which consumes electrical energy to prevent the array substrate test key from being damaged. The display panel comprises the array substrate test key.
Inventors:
TAN GANG (CN)
HE CHAO (CN)
HE CHAO (CN)
Application Number:
PCT/CN2019/092907
Publication Date:
November 26, 2020
Filing Date:
June 26, 2019
Export Citation:
Assignee:
WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO LTD (CN)
International Classes:
H01L27/12
Foreign References:
CN104992960A | 2015-10-21 | |||
CN101226954A | 2008-07-23 | |||
CN105097675A | 2015-11-25 | |||
CN101226953A | 2008-07-23 | |||
CN208336226U | 2019-01-04 | |||
CN206040646U | 2017-03-22 | |||
CN101562188A | 2009-10-21 | |||
CN105552026A | 2016-05-04 | |||
CN203616554U | 2014-05-28 | |||
CN105259722A | 2016-01-20 | |||
CN104090389A | 2014-10-08 | |||
US20160379907A1 | 2016-12-29 | |||
US9368484B1 | 2016-06-14 |
Attorney, Agent or Firm:
ESSEN PATENT&TRADEMARK AGENCY (CN)
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