Title:
ARRAY SUBSTRATE TEST KEY AND DISPLAY PANEL
Document Type and Number:
WIPO Patent Application WO/2021/196307
Kind Code:
A1
Abstract:
An array substrate test key (100) and a display panel having same. The array substrate test key (100) comprises a glass substrate (11), a multilayered buffer layer (12), an active layer (13), a gate insulating layer (14), a gate layer (15), an interlayer insulating layer (16), a source/drain layer (17), and a flat organic layer (18). The array substrate test key (100) is defined to have two test areas (10) and a connection area (20); each test area (10) is provided with a recess (101) that exposes the gate layer (15); and the gate layer (15) in each test area (10) is electrically connected to the source/drain layer (17) in the connection area (20).
Inventors:
TAN GANG (CN)
Application Number:
PCT/CN2020/085873
Publication Date:
October 07, 2021
Filing Date:
April 21, 2020
Export Citation:
Assignee:
WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO LTD (CN)
International Classes:
G02F1/13; G09G3/00; H01L21/66; H01L27/12; H01L27/32
Foreign References:
| CN110112149A | 2019-08-09 | |||
| CN110957329A | 2020-04-03 | |||
| CN104849880A | 2015-08-19 | |||
| CN104900674A | 2015-09-09 | |||
| CN103730384A | 2014-04-16 | |||
| CN109872983A | 2019-06-11 | |||
| CN103050060A | 2013-04-17 | |||
| CN104992960A | 2015-10-21 | |||
| CN105655350A | 2016-06-08 | |||
| US20140027720A1 | 2014-01-30 | |||
| JP2009186208A | 2009-08-20 | |||
| JP2002207223A | 2002-07-26 | |||
| JP2005268611A | 2005-09-29 | |||
| US20150015296A1 | 2015-01-15 | |||
| US20120007628A1 | 2012-01-12 |
Attorney, Agent or Firm:
PURPLEVINE INTELLECTUAL PROPERTY (SHENZHEN) CO., LTD. (CN)
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