Title:
ASSESSMENT DEVICE, ASSESSMENT SYSTEM, ASSESSMENT METHOD AND COMPUTER PROGRAM
Document Type and Number:
WIPO Patent Application WO/2011/114474
Kind Code:
A1
Abstract:
A reader (200) reads an IC tag (10) via an antenna (ANT) and assesses the similarity between the acquired read pattern and reference data for each assessment area. For the reference data, a pattern that the detector of a gate is to output when a tag is caused to pass through the gate and a pattern that the detector of the gate is to output when the tag is caused to pass through another gate are prepared. The assessment results are reported to a top-level server (100). The top-level server (100), on the basis of a similarity report from the reader (200), assesses whether the accuracy detected at the first-mentioned gate when the tag had been caused to pass through the gate or the accuracy detected at the first-mentioned gate when the tag had been caused to pass through the other gate was higher.
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Inventors:
SUGANO, Hiroyasu (())
菅野 博靖 (())
菅野 博靖 (())
Application Number:
JP2010/054597
Publication Date:
September 22, 2011
Filing Date:
March 17, 2010
Export Citation:
Assignee:
FUJITSU LIMITED (1-1 Kamikodanaka 4-chome, Nakahara-ku Kawasaki-sh, Kanagawa 88, 〒2118588, JP)
富士通株式会社 (〒88 神奈川県川崎市中原区上小田中４丁目１番１号 Kanagawa, 〒2118588, JP)
SUGANO, Hiroyasu (())
富士通株式会社 (〒88 神奈川県川崎市中原区上小田中４丁目１番１号 Kanagawa, 〒2118588, JP)
SUGANO, Hiroyasu (())
International Classes:
G06K17/00; B65G1/137; B65G61/00
Attorney, Agent or Firm:
KOHNO, Takao (KOHNO PATENT OFFICE, 4-3 Tsuriganecho 2-chome, Chuo-ku, Osaka-sh, Osaka 35, 〒5400035, JP)
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Claims:
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