ASSESSMENT PROGRAM, ASSESSMENT DEVICE, AND ASSESSMENT METHOD

Title:

ASSESSMENT PROGRAM, ASSESSMENT DEVICE, AND ASSESSMENT METHOD

Document Type and Number:

WIPO Patent Application WO/2017/199309

Kind Code:

A1

Abstract:

This assessment device (1): refers to a filled-out sheet (24) storing table information including a plurality of rows, each including a plurality of cells associated with characters or character strings; identifies the combination of the data types represented by the characters or character strings associated with the plurality of cells included in each row of the plurality of rows; refers to a mapping definition (22) storing information about the combination of the data types associated with the plurality of cells included in a particular row of the plurality of rows; acquires the data type combination stored in the mapping definition (22); compares the acquired data type combination with the identified data type combination for each of the plurality of rows; and assesses each row to be compared in accordance with the result of the comparison. In this way, the assessment device (1) can determine the starting position of each of a plurality of tables in the filled-out sheet when converting the filled-out sheet into an instance.

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Inventors:

ONOGI MAKIO (JP)
MURAMOTO TAKAHIDE (JP)
INOUE TAKAYUKI (JP)

Application Number:

PCT/JP2016/064521

Publication Date:

November 23, 2017

Filing Date:

May 16, 2016

Export Citation:

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Assignee:

FUJITSU LTD (JP)

International Classes:

G06F40/143; G06Q40/00

Foreign References:

JP2005352774A	2005-12-22
JPH08287172A	1996-11-01
JP2014021694A	2014-02-03

Other References: