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Title:
ATTACHED MATTER TESTING DEVICE AND TESTING METHOD
Document Type and Number:
WIPO Patent Application WO/2013/051530
Kind Code:
A1
Abstract:
According to the present invention it is possible to identify a sample material adhered to a test subject easily and with a high degree of accuracy, and an improvement in the work rate and a reduction in the number of personnel needed for testing can also be achieved. The present invention comprises detection means for detecting the size (length/width dimensions) of the test subject and, depending on the size of the test subject detected by the detection means, air nozzles which can spray air jets at 15 m/s or more onto a test material surface are chosen from a plurality of air nozzles, and air jet spraying takes place.

Inventors:
KASHIMA HIDEO (JP)
SUGAYA MASAKAZU (JP)
TERADA KOICHI (JP)
DOI YASUNORI (JP)
SUZUKI YASUTAKA (JP)
NAGANO HISASHI (JP)
HASHIMOTO YUICHIRO (JP)
TAKADA YASUAKI (JP)
Application Number:
PCT/JP2012/075459
Publication Date:
April 11, 2013
Filing Date:
October 02, 2012
Export Citation:
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Assignee:
HITACHI LTD (JP)
International Classes:
G01N1/02
Foreign References:
JP2009031316A2009-02-12
JPH02198333A1990-08-06
JPH0833338B21996-03-29
JPS63134933A1988-06-07
JPH076729A1995-01-10
JPH01212849A1989-08-25
JP2008018355A2008-01-31
JP2008138966A2008-06-19
Attorney, Agent or Firm:
HIRAKI Yusuke et al. (JP)
Yusuke Hiraki (JP)
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