Title:
ATTACHMENT FOR OPTICAL CHARACTERISTIC MEASURING APPARATUS, AND OPTICAL CHARACTERISTIC MEASURING APPARATUS
Document Type and Number:
WIPO Patent Application WO/2014/061191
Kind Code:
A1
Abstract:
Each of the attachment for an optical characteristic measuring apparatus, and the optical characteristic measuring apparatus of the present invention is provided with an antireflection member for eliminating reflection of illuminating light, said antireflection member being provided on the inner surface of a hollow columnar attachment main body, which can be attached to and detached from the optical characteristic measuring apparatus, and which blocks external light. While maintaining measuring functions for general samples, the configuration makes it possible to measure samples wherein optical characteristics of the rear surface affect the optical characteristics of the front surface, said samples being, for instance, protection panels to be used in display panels and solar cells.
Inventors:
OGAWA YOSHIHIKO (JP)
OSAKI SHIGERU (JP)
YOKOTA SATOSHI (JP)
OSAKI SHIGERU (JP)
YOKOTA SATOSHI (JP)
Application Number:
PCT/JP2013/005262
Publication Date:
April 24, 2014
Filing Date:
September 05, 2013
Export Citation:
Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01J3/50
Foreign References:
| JP2011133463A | 2011-07-07 | |||
| JP2010043932A | 2010-02-25 | |||
| JP2010091509A | 2010-04-22 | |||
| JPH08193961A | 1996-07-30 |
Attorney, Agent or Firm:
KOTANI, Etsuji et al. (JP)
Etsuji Kotani (JP)
Etsuji Kotani (JP)
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