Title:
AUTOMATED ANALYSIS DEVICE, AND METHOD FOR OPERATING AUTOMATED ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/062831
Kind Code:
A1
Abstract:
This automated analysis device comprises an analyzing unit 40 for analyzing a sample, and a control device 20 for controlling operations of each mechanism of the analyzing unit 40, wherein the control device 20 calculates a waiting time that a user should wait until the sample or a consumable required to analyze the sample is replaced, on the basis of a time at which the sample or the consumable is to be used last, in an analysis schedule created at a time point at which a replacement request for the sample or the consumable is accepted. By this means, the present invention provides an automated analysis device, and a method for operating the automated analysis device, capable of improving work efficiency.
Inventors:
ONOSE TOMA (JP)
SHIBUYA SATOSHI (JP)
TAKAKURA TATSUKI (JP)
DATZ STEFAN (DE)
FOESTER ELISABETH (DE)
PAUSELIUS-FUCHS URSULA (DE)
BISHR BASSEM (CH)
DEGROOT PETER (CH)
SHIBUYA SATOSHI (JP)
TAKAKURA TATSUKI (JP)
DATZ STEFAN (DE)
FOESTER ELISABETH (DE)
PAUSELIUS-FUCHS URSULA (DE)
BISHR BASSEM (CH)
DEGROOT PETER (CH)
Application Number:
PCT/JP2023/030361
Publication Date:
March 28, 2024
Filing Date:
August 23, 2023
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
HOFFMANN LA ROCHE (CH)
ROCHE DIAGNOSTICS GMBH (DE)
ROCHE DIAGNOSTICS OPERATIONS INC (US)
HOFFMANN LA ROCHE (CH)
ROCHE DIAGNOSTICS GMBH (DE)
ROCHE DIAGNOSTICS OPERATIONS INC (US)
International Classes:
G01N35/00
Domestic Patent References:
| WO2022070471A1 | 2022-04-07 |
Foreign References:
| JP2005274470A | 2005-10-06 | |||
| JP2017053684A | 2017-03-16 | |||
| JP2021139784A | 2021-09-16 |
Attorney, Agent or Firm:
KAICHI IP (JP)
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