AUTOMATED ANALYSIS DEVICE - HITACHI HIGH TECH CORP

Title:

AUTOMATED ANALYSIS DEVICE

Document Type and Number:

WIPO Patent Application WO/2019/198455

Kind Code:

A1

Abstract:

This automated analysis device is provided with: analyzing units 8, 9, 16 for performing analysis, and for performing precision management analysis to ensure analysis precision; a storage medium 1a which stores precision management results of the precision management analysis performed by the analyzing units 8, 9, 16; a monitor 2 which displays the precision management results; and a control PC 1 which controls the operation of the analyzing units 8, 9, 16, and when any result is selected from among the precision management results stored in the storage medium 1a, executes a statistical calculation of the selected result and the precision management results conducted previous thereto, on the basis of the selected precision management result, and causes a statistical calculation screen 300, which is the result of the statistical calculation, to be displayed on the monitor 2.

Inventors:

HIRABAYASHI YUICHI (JP)
INAGI DAI (JP)
YOKOTSUKA SATOSHI (JP)
ARUGA YOUICHI (JP)
ABOUELSOUD MOHAMED (DE)

Application Number:

PCT/JP2019/011857

Publication Date:

October 17, 2019

Filing Date:

March 20, 2019

Export Citation:

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Assignee:

HITACHI HIGH TECH CORP (JP)
ROCHE DIAGNOSTICS GMBH (DE)
ROCHE DIAGNOSTICS OPERATIONS INC (US)
HOFFMANN LA ROCHE (CH)

International Classes:

G01N35/00

Domestic Patent References:

WO2016140017A1	2016-09-09
WO2016140017A1	2016-09-09

Foreign References:

JP2010217039A	2010-09-30
JP2009052969A	2009-03-12
JP2015092196A	2015-05-14

Other References: