Title:
AUTOMATED ANALYZER AND AUTOMATED ANALYSIS SYSTEM
Document Type and Number:
WIPO Patent Application WO/2017/033648
Kind Code:
A1
Abstract:
The purpose of the present invention is to attain an automated analyzer that keeps the costs required for inspection to a minimum and is capable of starting measurement immediately after being turned on. As a solution, provided is an automated analyzer provided with an analysis operation part that causes a sample and a reagent to react and on the basis of the reaction result performs analysis of the sample, wherein: the automated analyzer comprises a plurality of units constituting the analysis operation part, a temperature adjustment mechanism that heats or cools the units, a temperature sensor that measures the temperature of the units, and a control part that controls the temperature adjustment mechanism; and the control part sets the measurement startable temperature range of each unit, which is the temperature range of the operation specification thereof, and the operable temperature range, which is a temperature range that is wider than the measurement startable temperature range, and starts the analysis process of the sample when the temperature of the unit has entered the operable temperature range of the unit.
Inventors:
SASAKI SHUNSUKE (JP)
IMAI KENTA (JP)
SUZUKI TOSHIHARU (JP)
SAKAMOTO KATSUHIKO (JP)
IMAI KENTA (JP)
SUZUKI TOSHIHARU (JP)
SAKAMOTO KATSUHIKO (JP)
Application Number:
PCT/JP2016/071665
Publication Date:
March 02, 2017
Filing Date:
July 25, 2016
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/00
Foreign References:
| JP2006003222A | 2006-01-05 | |||
| JP2003139690A | 2003-05-14 | |||
| JP2014081392A | 2014-05-08 | |||
| JP2010066108A | 2010-03-25 | |||
| JP2005181123A | 2005-07-07 |
Other References:
See also references of EP 3343228A4
Attorney, Agent or Firm:
INOUE Manabu et al. (JP)
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