Title:
AUTOMATED ANALYZER AND DISPLAY METHOD FOR DISPLAY DEVICE OF AUTOMATED ANALYZER
Document Type and Number:
WIPO Patent Application WO/2021/002050
Kind Code:
A1
Abstract:
At a prescribed timing, a display device 303 is made to display a masking cause list screen 500 consolidating masking states, of either masked or not masked, that are stored in a storage device 302 and masking causes for each case of masking in the masking states. As a result, an automated analyzer and a display method for a display device of the automated analyzer are provided that make it possible to display masking states and causes in a list even before analysis and suppress analysis efficiency degradation and running cost growth compared with the prior art.
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Inventors:
KADOYA RYUSHI (JP)
AKUTSU MASASHI (JP)
ENTA KUNIO (JP)
AKUTSU MASASHI (JP)
ENTA KUNIO (JP)
Application Number:
PCT/JP2020/008158
Publication Date:
January 07, 2021
Filing Date:
February 27, 2020
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/00
Domestic Patent References:
| WO2017038235A1 | 2017-03-09 |
Foreign References:
| JP2013140103A | 2013-07-18 | |||
| JP2013076619A | 2013-04-25 | |||
| JP2012251909A | 2012-12-20 | |||
| JP2004028932A | 2004-01-29 |
Attorney, Agent or Firm:
KAICHI IP (JP)
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