Title:
AUTOMATED INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/207481
Kind Code:
A1
Abstract:
[Problem] To provide an automated detection unit wherefor little or no change of inspection scenario is necessary even in the event of device specification information being changed. [Solution] The automated inspection device 20 comprises a conversion unit 30, an output unit 31, an acquisition unit 32, and an inspection unit 42. From among inspection scenarios that include a process to be carried out by a device to be inspected 10 and either an anticipated operation or anticipated data of the device to be inspected, the conversion unit 30 converts the process to be carried out by the device to be inspected 10 into a conversion signal corresponding to device specification information. The output unit 31 outputs the conversion signal to the device to be inspected 10. The acquisition unit 32 acquires a response data of the device to be inspected 10, said response data having been acquired in response to the conversion signal. The inspection unit 42 computes a degree of matching between the response data and either the anticipated operation or the anticipated data included in either the device specification information or the inspection scenario.
Inventors:
HIRAOKA YASUSHI (JP)
TSUDAKA KENTARO (JP)
TSUDAKA KENTARO (JP)
Application Number:
PCT/JP2018/012371
Publication Date:
November 15, 2018
Filing Date:
March 27, 2018
Export Citation:
Assignee:
FURUNO ELECTRIC CO (JP)
International Classes:
G06F11/36; G06V30/10
Foreign References:
| JP2007328509A | 2007-12-20 | |||
| JP2015049659A | 2015-03-16 | |||
| JPH11212825A | 1999-08-06 | |||
| JP2005196672A | 2005-07-21 | |||
| JP2016062136A | 2016-04-25 | |||
| JP4006224B2 | 2007-11-14 | |||
| JP2009290852A | 2009-12-10 | |||
| JPH07253905A | 1995-10-03 |
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