Title:
AUTOMATED INSPECTION SYSTEM AND AUTOMATED INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2018/123298
Kind Code:
A1
Abstract:
Provided is an automated inspection system that uses a wireless network comprising: wireless inferior stations comprising image capture units which photograph measurement devices that measure physical quantities of objects to be inspected; and wireless superior stations which receive, from the wireless inferior stations, image data obtained through photography by the image capture units. The wireless inferior stations further comprise: binarization units which binarize the image data to generate binarized image data; reduction units which cut out, from the binarized image data, image data corresponding to measurement value sections of the measurement devices; and transmission units which transmit to the wireless superior stations the measurement value section image data having been cut out.
Inventors:
SASAKI REISO (JP)
NISHIMURA TAKUMA (JP)
KASHIWABARA HIROSHIGE (JP)
OHHATA TAKETSUGU (JP)
KIDO SHINICHIRO (JP)
NISHIMURA TAKUMA (JP)
KASHIWABARA HIROSHIGE (JP)
OHHATA TAKETSUGU (JP)
KIDO SHINICHIRO (JP)
Application Number:
PCT/JP2017/040740
Publication Date:
July 05, 2018
Filing Date:
November 13, 2017
Export Citation:
Assignee:
HITACHI LTD (JP)
HITACHI IND & CONTROL SOLUTIONS LTD (JP)
HITACHI IND & CONTROL SOLUTIONS LTD (JP)
International Classes:
G08C19/00; G08C15/00; G08C17/02; H04Q9/00
Foreign References:
| JP2003065812A | 2003-03-05 | |||
| JP2014032039A | 2014-02-20 | |||
| JP2008234160A | 2008-10-02 | |||
| JP2015187849A | 2015-10-29 | |||
| JP2014064155A | 2014-04-10 | |||
| JP2006309405A | 2006-11-09 |
Attorney, Agent or Firm:
SHIN-YU INTERNATIONAL PATENT FIRM (JP)
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