AUTOMATIC ANALYSIS APPARATUS - HITACHI HIGH TECH CORP

Title:

AUTOMATIC ANALYSIS APPARATUS

Document Type and Number:

WIPO Patent Application WO/2016/136438

Kind Code:

A1

Abstract:

The purpose of the present invention is to achieve an automatic analysis apparatus that can accurately perform dispensation abnormality detection without causing a drop in discrimination performance stemming from the composition balance of a reference database and without increasing the scale of the computational quantity. A dispensing nozzle of a sample dispensing mechanism 50 is immersed in the object to be dispensed contained in a specimen container 11, and the internal pressure of the dispensing nozzle of the sample dispensing mechanism 50 that suctions and discharges the object to be dispensed into a reaction vessel 41 is detected by a pressure sensor 54. A plurality of characteristic values are extracted from the waveform of the detected pressure, the plurality of characteristic values are input, and a determination result is output by a linear combination formula that uses optimized coefficients for a discriminant function that outputs one value. On the basis of the magnitude of the output result of the discriminant function, the determination result indicates whether or not dispensation of the sample dispensing mechanism 50 was performed normally.

Inventors:

TAMEZANE HIDETO (JP)
YAMAZAKI ISAO (JP)
NISHIDA MASAHARU (JP)
KAMOSHIDA RYOTA (JP)

Application Number:

PCT/JP2016/053570

Publication Date:

September 01, 2016

Filing Date:

February 05, 2016

Export Citation:

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Assignee:

HITACHI HIGH TECH CORP (JP)

International Classes:

G01N35/10; G01N35/00

Foreign References:

JP2010014434A	2010-01-21
JP2014149187A	2014-08-21
JP2014044174A	2014-03-13

Other References: