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Patent Searching and Data


Title:
AUTOMATIC ANALYSIS DEVICE AND MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2011/001647
Kind Code:
A1
Abstract:
An automatic analysis device and a measurement method which are capable of performing multiple items of analysis processing using a simple configuration. An automatic analysis device (1) for performing analysis processing of a specimen by optically measuring the reaction between the specimen and a reagent. The automatic analysis device (1) comprises: a magnetic particle extraction unit (2) which is provided with a magnetic flux concentration member (24) having disposed therein a magnetic body for concentrating the magnetic flux of magnetic particles (B) from the inside of a reaction container (12) and retaining the magnetic particles (B), the magnetic particles (B) being contained in fluid which is held in the reaction container (12) and having bonded thereto a marker substance to be measured, the magnetic particle extraction unit (2) being adapted to extract the magnetic particles (B) to the outside of the reaction container (12); and a magnetic particle measuring unit (10) which optically measures the marker substance bonded to the magnetic particles (B) extracted to the outside of the reaction container (12) by the magnetic particle extraction unit (2).

Inventors:
MIZUTANI TAKAYUKI (JP)
WATANABE KYOKO (JP)
Application Number:
PCT/JP2010/004219
Publication Date:
January 06, 2011
Filing Date:
June 24, 2010
Export Citation:
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Assignee:
BECKMAN COULTER INC (US)
MIZUTANI TAKAYUKI (JP)
WATANABE KYOKO (JP)
International Classes:
G01N35/02; B03C1/00; B03C1/02
Domestic Patent References:
WO2006107016A12006-10-12
Foreign References:
JPS62502708A1987-10-15
JPH08506661A1996-07-16
Attorney, Agent or Firm:
YAMAMOTO, Shusaku et al. (JP)
Shusaku Yamamoto (JP)
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