AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

Title:

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

Document Type and Number:

WIPO Patent Application WO/2018/163917

Kind Code:

A1

Abstract:

The address the problem of preventing contamination, the present invention is characterized by being provided with a reagent nozzle (H) for discharging a reagent (M1) at a predetermined discharge pressure to a reaction vessel (V) in which a specimen (M2) is accommodated, a control unit for controlling the horizontal position of the reagent nozzle (H) in accordance with the liquid amount of the reagent (M1) and the viscosity of the reagent (M1), a dispensing unit for dispensing the reagent (M1) into the reaction vessel (V), and a photometer for detecting light radiated to a mixture of the specimen (M2) and the reagent (M1), the control unit setting the horizontal position of the reagent nozzle (H) to the center position of the reaction vessel (V) when the liquid amount of the reagent (M1) is greater than the amount of the specimen (M2) and the viscosity of the reagent (M1) is equal to the viscosity of the specimen (M2) or lower than the viscosity of the specimen (M2).

Inventors:

AKASE HIROKI (JP)
IIJIMA MASAHIKO (JP)
YABUTANI CHIE (JP)
SAWADA TAKANORI (JP)
KONISHI REI (JP)

Application Number:

PCT/JP2018/007335

Publication Date:

September 13, 2018

Filing Date:

February 27, 2018

Export Citation:

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Assignee:

HITACHI HIGH TECH CORP (JP)

International Classes:

G01N35/10

Domestic Patent References:

WO2014097973A1	2014-06-26
WO2016136377A1	2016-09-01
WO2014097973A1	2014-06-26
WO2015079829A1	2015-06-04

Foreign References:

JP2016217921A	2016-12-22
JP2009145143A	2009-07-02
JP2012093311A	2012-05-17
JP2015215367A	2015-12-03

Other References: