Title:
AUTOMATIC ANALYSIS DEVICE AND SPECIMEN INSPECTION AUTOMATION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2017/033537
Kind Code:
A1
Abstract:
In order to easily identify a specimen to be extracted because, for example, an item remains uninspected, from a rack 31 collected in a storage part 13 or the rack 31 taken out from the storage part 13: a camera 18d of a smart device 18 takes an image of the rack 31; and a calculation unit 18e included in the smart device 18 provides a mark 32, by AR technology, at the position of a specimen to be extracted because, for example, an item remains uninspected, on the basis of information about combination of a rack ID 33 and an identifier 34 and information, which is received from an operation unit 16, about specimens at respective positions. Thus, irrespective of a place or whether being inside or outside of the device, a specimen to be extracted can be reliably specified from a plurality of specimen containers provided on a holder.
Inventors:
YASUZAWA KENICHI (JP)
SATO TSUGUHIKO (JP)
MORI HIROKI (JP)
SATO TSUGUHIKO (JP)
MORI HIROKI (JP)
Application Number:
PCT/JP2016/067784
Publication Date:
March 02, 2017
Filing Date:
June 15, 2016
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/02; G01N35/00
Foreign References:
| JP2004045396A | 2004-02-12 | |||
| JP2013228233A | 2013-11-07 | |||
| US20050187733A1 | 2005-08-25 | |||
| US20150099306A1 | 2015-04-09 | |||
| JP2015523113A | 2015-08-13 | |||
| JP2014532880A | 2014-12-08 |
Other References:
See also references of EP 3343230A4
Attorney, Agent or Firm:
KAICHI IP (JP)
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